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1. #Wireless transfer app for windows 10 version 4.5.2 full#
2. #Wireless transfer app for windows 10 version 4.5.2 software#

#Wireless transfer app for windows 10 version 4.5.2 software#

3 System Requirements and Software Installation.2 Communicating with Solinst Dataloggers.1.2.4.1 Calibration of the Conductivity Sensor.3001 Levelogger® 5 Series Software User Guide.3001 Levelogger® 5 Series Quick Start Guide.Solinst Probe Other fault (Probe returns BCC offset by +56).Īll Rights Reserved - Copyright © 2023 Solinst Canada Ltd. Solinst Bus CRC error received by Probe (returning BCC offset by+ 7). Solinst Bus CRC error received at wellhead. Malformed string (incomplete/invalid Unicode/characters, incorrect termination/padding, etc.) The wellhead translator doesn't recognize the probe type. The client may retry the request later.Īddress used doesn't match the beginning of a valid register field, or byte count doesn't match size of data type being addressed.Īttempting to read from a write only registerĪttempting to write data that is outside the valid range for the variable being addressed. The request could not be processed at this time, but is expected to be available immanently. Register range requested extends beyond supported register map The bootloader memory computed checksum is compared to a 4-byte checksum stored in FLASH.īits 11 to 31 are reserved for future use.

#Wireless transfer app for windows 10 version 4.5.2 full#

A full memory test of all bytes typically takes about 5 to 10 seconds-depending on the amount of installed logging memory.īootloader FLASH checksum test (Bit 10). Blocks of bytes are non-destructively written/verified for the entire logging memory range. If this reading is between 810000H and B000000H, the test will pass.įull Logging memory test (Bit 8). The raw pressure sensor A/D value is read. If this reading is between 740000H and E50000H, the test will pass. The raw temperature sensor A/D value is read. As 5) except the high-memory device is tested. Blocks of bytes are non-destructively written/verified for the first 512-byte segment of each 4096 byte logging memory page for the low-memory device. LTCG will only test portions of the FRAM. We will read/write various test patterns to the entire FRAM device. The information memory computed checksum is compared to a 2-byte checksum stored in FLASH.įRAM test (Bit 3). The program memory computed checksum is compared to a 4-byte checksum stored in FLASH. The external A/D's battery voltage will be used to generate a power supply fault whenever the voltage is below 3.1V.